What are the different types of scanning microscopes?
There are several types of scanning microscopes including scanning electron microscope, scanning tunnel microscope and atomic microscope. Usually scanning microscopes consist of a probe or beam of electrons that scan the sample surface. The interaction between the scanning microscope and the sample is created by measurable data, such as the current change, the probe deflection or the production of secondary electrons. This data is used to create an image of the sample surface on the atomic level.
The scanning electron microscope is one of several types of scanning microscopes used to display the sample. The microscope detects the signals resulting from the interaction of its electron beam with atoms on the sample surface. Several types of signals are usually produced, including light, X -rays and electrons.
There are several types of electrons that can be measured with this microscope, including transmitted electrons, electrons with a backbone scattering secondary electrons. They usually have a scanning electronThe microscopes detector for secondary electrons, which are released electrons produced from the primary radiation source, namely electron beam. Secondary electrons provide information on the physical structure of the surface atomic level. In general, the microscope represents an area of 1-5 nanometers.
Scanning microscopes that use a probe such as a scanning tunnel microscope produce images with higher resolution than a scanning electron microscope. The scanning tunnel microscope is equipped with a conductive tip that is located very close to the sample. The difference in voltage between the leading tip and the sample causes the electrons to the tunnel from the sample to the tip.
When the electrons cross, the tunnel current is formed and measured. Once the leading tip moves, the current changes, reflecting the difference in height or density on the surface of the sample. With these data, the surface of the surface of the atomic level is designed.
mikRoscal atomic force is another scanning microscope that has a probe. It consists of a bracket and a sharp tip that is located near the sample surface. When the tip approaches the sample, the forces between the tip and the sample cause the console to divert. Usually the forces include mechanical contact force, van der waals power and electrostatic force.
Usually, the console deflection is measured using a laser that is focused on the upper surface of the console. The deflection reveals the physical shape of the surface at a certain point. The sample and probe are moved for scanning the entire surface. The image is designed from the data obtained by the laser.