What is a microscope scanning probes?

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microscope scanning probes is some of several microscopes that produce three -dimensional surface images in very high details, including an atomic scale. Depending on the microscopic technique used, some of these microscopes may also measure the physical properties of the material, including electric current, conductivity and magnetic fields. The first microscope scanning probes, called scanning tunnel microscope (STM), was invented in the early 80s. The inventors of STM won the Nobel Prize in Physics a few years later. Since then, several other techniques have been invented on the same basic principles. The tip of the scanning probes must be smaller than the scanned elements on the surface to create an accurate image. These tips must be replaced every few days. Usually, the mountains are on the console and in many SPM techniques, the bracket is measured to determine the surface height.

In the microscopy of the scan tunnel, electric current is applied between the scanning tip and the surface display. This current is maintained by constantly adjusting the height of the tip, creating a topographic surface image. Alternatively, the height of the tip can be kept constant while changing current is changed to determine the height of the surface. Because this method uses electric current, it is only applicable to materials that are conductors or semiconductors.

Several types of microscope scanning probe falls into the category of atomic forces (AFM). Unlike the microscopy of the scanning tunnel, AFM can be used on all types of materials regardless of their conductivity. All AFM types use some indirect meters of forces between the scanning tip and the surface to create an image. This is usually achieved by measuring the bracket deflection. Different types of atomic microscope include AFM contact, non -contact AFM and occasional contact AFM. Several considerations determine which type of microscopy atomicForces are best for a particular application, including the sensitivity of the material and the sample size to be scanned.

There are several variations on basic types of atomic force microscopy. The microscopy of the side force (LFM) measures the torque on the scanning tip, which is useful for mapping surface friction. The scanning capacity microscopy is used to measure the sample capacity and at the same time create a topographic image of AFM. Atomic atomic force microscopes (C-AFM) use a conductive tip as well as STM, creating a topographic image of AFM and an electricity map. Modulation microscopy of force (FMM) is used to measure the elastic properties of the material.

There are also other techniques of scanning probes for measuring properties other than three -dimensional surface. Electrostatic forces (EFM) are used to measure the electric charge on the surface. These are sometimes used to test microprocessor chips. Scanning thermal microscopy (STHM) collects data on thermalGuidance and mapping of surface topography. Magnetic force microscopes (MFM) measure the magnetic field on the surface along with topography.