What Is Thin Film Characterization?
Reference books for teaching, research, technical staff, and graduate and advanced undergraduates in related fields. [1]
Characterization of organic thin films
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- Book title
- Characterization of organic thin films
- Author
- Abraham Ulman
- ISBN
- 978-7-5603-4287-0
- Pages
- 296
- Fixed price
- 98.00 yuan
- date of publish
- 2014.01
- Open
- 16
- Reference books for teaching, research, technical staff, and graduate and advanced undergraduates in related fields. [1]
- Preface to the Reissue of the Materials Characterization Series
- Preface to Series
- Preface to the Reissue of Characterization of Organic Thin Films
- Preface
- Contributors
- PART : PREPARATION AND MATERIALS LANGMUIRBLODGETT FILMS
- 1.1 Introduction
- 1.2 LB Films of LongChain Compounds
- FattyAcids
- Amines
- Other LongChain Compounds
- 1.3 Cyclic Compounds and Chromophores
- 1.4 Polymers and Proteins
- 1.5 Polymerization In Situ
- 1.6 Alternation Films (Superlattices)
- 1.7 PotentiaIApplications
- SELFASSEMBLED MONOIAYERS
- 2.1 Introduction
- 2.2 Monolayers of Fatty Acids
- 2.3 Monolayers of Organosilicon Derivatives
- 2.4 Monolayers of Alkanethiolates on Metal and Semiconductor Surfaces
- 2.5 Self-Assembled Monolayers Containing Aromatic Groups
- 2.6 Conclusions
- PART: ANALYSIS OF FILM AND SURFACEPROPERTIES
- SPECTROSCOPIC ELLIPSOMETRY
- 3.1 Introduction and Overview
- 3.2 Theory of Ellipsometry
- 3.3 Instrumentation
- 3.4 Determination of Optical Properties
- Analysis of Single Eliipsometric Spectra: Direct Inversion Methods
- Analysis of Single Ellipsometric Spectra: Least Squares Regression Analysis Method
- Analysis of Multiple Ellipsometric Spectra
- 3.5 Determination of Thin Film Structure
- Thickness Determination for Monolayers
- Microstructural Evolution in Thick Film Growth
- 3.6 Future Prospects
- INFRARED SPECTROSCOPYIN THE CHARACTERIZATION OF ORGANIC THIN FILMS
- 4.1 Introduction
- Specific Needs for Characterizing Organic Thin Films
- General Prinaples and Capabilities of Infrared Spectroscopy for Surface and Thin Film Analysis
- 4.2 Quantitative Aspects
- Spectroscopiclntensities
- Electromagnetic Fields in Thin Film Structures
- 4.3 The Infrared Spectroscopic Experiment
- General Instrumentation
- Experimental Modes
- Additional Aspects
- 4.4 Examples of Applications
- SelfAssembled Monolayers on Gold by External Reflection
- Octadecylsiloxane Monolayers on SiO2 byTransmission
- LangmuirBlodgett Films on Nonmetallic Substrates by External Reflection
- RAMAN SPECTROSCOPIC CHARACTERIZATION OF ORGANIC THIN FILMS
- 5.1 Introduction
- 5.2 FundamentalsofRaman Spectroscopy
- 5.3 InstrumentaIConsiderations
- 5.4 Raman Spectroscopic Approaches for the Characterization of OrganicThin Films
- Integrated OpticaIWaveguide Raman Spectroscopy (IOWRS)
- Total Internal Reflection Raman Spectroscopy
- Surface Enhanced Raman Scattering
- Normal Raman Spectroscopy
- Resonance Raman Spectroscopy
- Plasmon Surface Polariton Enhanced Raman Spectroscopy
- FourierTransform Raman Spectroscopy
- Waveguide Surface Coherent AntiStokes Raman Spectroscopy (WSCARS)
- 5.5 Selected Examples of Thin Film Analyses
- Raman Spectral Characterization of LangmuirBlodgett Layers of Arachidate and Stearate Salts
- Raman Spectral Characterization of SelfAssembled Monolayers of Alkanethiols on Metals
- Surface Enhanced Resonance Raman Spectral Characterization of LangmuirBlodgett Layers of Phthalocyanines
- 5.6 Prospects for Raman Spectroscopic Characterization of Thin Films
- SURFACE POTENTIAL
- 6.1 Introduction
- 6.2 Origins of the Contact Potential Difference and Surface Potential
- The Work Function
- Contact Potential Difference and Surface Potential
- Surface Potential Changes Induced by Adsorbates
- 6.3 Measurement of Surface Potential
- CapacitanceTechniques
- IonizingProbeTechnique
- 6.4 Surface Potentials of OrganicThin Films
- AirWater Interface: Surface Potential of Langmuir Mono layers
- AirSolidlnterface: Surface Potential of LB and Related Films
- 6.5 Conclusions
- XRAY DIFFRACTION
- 7.1 Introduction
- 7.2 Basic Principles
- 7.3 StructureNormalto Film Plane
- 7.4 Structure Within the Film Plane
- 7.5 Summary
- HIGH RESOLUTION EELS STUDIES OF ORGANIC THIN FILMS AND SURFACES
- 8.1 Introduction
- 8.2 TheScatteringMechanism
- DipoleScattering
- Impact Scattering
- Resonance Scattering
- 8.3 TheSpectrometer
- 8.4 EELS Versus Other Techniques: Advantages and Disadvantages
- 8.5 Examples
- ResolutionEnhancement
- Linearity
- Depth Sensitivity
- Molecular Orientation
- Local Versus Long--Range lnteractions
- SurfaceS egregation
- 8.6 Conclusions
- WETTING
- 9.1 Introduction
- 9.2 ContactAngles
- 9.3 Techniques for Contact Angle Measurements
- Axisymmetric Drop ShapeAnalysis-Profile (ADSA-P)
- Axisymmetric Drop Shape AnalysisContact Diameter (ADSACD)
- Capillary Rise Technique
- 9.4 Phase Rule for Moderately Curved Surface Systems
- 9.5 Equation of State for InterfacialTensions of Solid Liquid Systems
- 9.6 Drop Size Dependence of Contact Angle and Line Tension
- 9.7 Contact Angles in the Presence ofa Thin Liquid Film
- 9.8 Effects of Elastic LiquidVaporlnterfaces on Wetting
- SECONDARY ION MASS SPECTROMETRY AS APPLIED TO THIN ORGANIC AND POLYMERIC FILMS
- 10.1 Introduction and Background
- Overview of the SIMS Method and Experiment
- Ion FormationMechanisms
- Comparisons to Other Surface Analysis Techniques
- The Motivation for Thin Organic Films as Model Systems
- 10.2 Qualitative Information: Mechanisms of Secondary Molecularlon Formation
- StructureIon Formation Relationships
- Applications to SelfAssembled Film Chemistry
- 10.3 The Study of Sampling Depth in the SIMS Experiment
- 10.4 Quantitationin SIMS
- Development of Quantitation Methods
- Applicationof Quantitative Schemes to Thin Film Chemistry
- 10.5 ImagingApplications
- 10.6 Summary and Prospects
- XRAY PHOTOELECTRON SPECTROSCOPY OF ORGANIC THIN FILMS
- 11.1 Introduction
- 11.2 Experimental Considerations
- 11.3 Binding Energy Shifts
- 11.4 XPS of Molten Films
- 11.5 Angular Dependent XPS
- 11.6 ETOAXPS of Self--Assembled Monolayers
- 11.7 Conclusions
- MOLECUlAR ORIENTATION IN THIN FILMS AS PROBED BY OPTICAL SECOND HARMONIC GENERATION
- 12.1 Introduction
- 12.2 Experimental Considerations
- 12.3 Molecular Nonlinear Polarizabiliry Calculation
- 12.4 Measurements of the Surface Nonlinear Susceptibility
- 12.5 Molecular Orientation Calculation
- Casel: zzzonly
- Case2: zxxonly
- Case3: xxz (= xzx) only
- Case4: zzz and zxx
- Case5: zxx and xxz (= xzx)
- 12.6 Absolute Molecular Orientation Measurements
- 12.7 Summary and Conclusions
- APPENDIX: TECHNIQUE SUMMARIES
- I Auger Electron Spectroscopy (AES)
- 2 DynamicSecondarylon Mass Spectrometry (DynamicSIMS) 252
- 3 FourierTransformlnfraredSpectroscopy (FTIR) 253
- 4 HighResolution Electron Energy Loss Spectroscopy (HREELS)
- 5 LowEnergy Electron Diffraction (LEED)
- 6 Raman Spectroscopy
- 7 Scanning Electron Microscopy (SEM)
- 8 Scanning Tunneling Microscopy (STM) and Scanning Force Microscopy (SFM)
- 9 Static Secondarylon Mass Spectrometry (Static SIMS)
- 10 Transmission Electron Microscopy (TEM)
- 11 VariableAngle Spectroscopic Ellipsometry (VASE)
- 12 XRay Diffraction XRD)
- 13 X-Ray Fluorescence (XRF)
- 14 X-Ray Photoelectron Spectroscopy (XPS)
- Index [1]