What Is the Slit Lamp Examination?
Slit-lamp microscopy is to illuminate the inspection site with a concentrated light source, which presents a strong contrast with the dark surroundings, and cooperates with a binocular microscope to not only make the superficial lesions clearly visible, but also use fine Gap bands form a series of "optical cut planes" through the transparent tissue of each part of the eyeball, so that different levels of refractive interstitial stratum and even small lesions in deep tissues are clearly displayed. Under the magnification of the binocular microscope, the target has a three-dimensional effect, which increases the accuracy of the inspection.
Slit Lamp Microscopy
- Chinese name
- Slit Lamp Microscopy
- Short name
- Slit-lamp microscopy is to illuminate the inspection site with a concentrated light source, which presents a strong contrast with the dark surroundings, and cooperates with a binocular microscope to not only make the superficial lesions clearly visible, but also use fine Gap bands form a series of "optical cut planes" through the transparent tissue of each part of the eyeball, so that different levels of refractive interstitial stratum and even small lesions in deep tissues are clearly displayed. Under the magnification of the binocular microscope, the target has a three-dimensional effect, which increases the accuracy of the inspection.
- Slit Lamp Living Microscope
- Inspections were performed in a dark room. First adjust the patient's sitting position so that the patient's jaw rests on the bracket, the forehead and the crossbar above the bracket closely, adjust the height of the lower jaw bracket, so that the palpebral fissure is consistent with the microscope. Open your eyes naturally and look forward. The projection direction of the light source is generally at an angle of 30-50 ° with the observation direction of the microscope. The narrower the light, the thinner the cut surface, and the clearer the layers. On the other hand, the wider the light, the local illumination is enhanced, but the level is not as clear as the narrow gap light band. In order to make the target clear, the focus of the projected light and the focus of the microscope are usually focused on the part to be inspected at the same time. For special inspections (such as side-illumination, back-illuminating, etc.), the The relationship must be adjusted separately. If you need to inspect the periphery of the lens, vitreous body, or fundus, the pupil should be fully enlarged in advance, and the angle between the light source and the microscope should be lower than 30 °. The microscope moves from front to back with the focus, and the inspected part can reach the fundus from the cornea. However, when inspecting the posterior vitreous body, retina, and peripheral parts of the fundus, if a front mirror or a three-sided mirror is used, the incident angle of the light should be reduced to 5 to 13 ° or less.