What are the different types of testing integrated circuits?
Integrated circuit testing is essential for the functionality of most electronic devices. Microchips, as known by integrated circuits, can be found on computers, mobile phones, cars and virtually anything that contains electronic components. Without testing both before the final installation and after installation on the circuit board, many devices arrive in a broken or stop functioning earlier than their expected life range. There are two main categories of testing integrated circuits, wafer testing and testing of the board level. In addition, tests based on structural or functional may be. This test is carried out using an automated test device (ATE) on a complete silicon wafer from which a square matrix on chips will be reduced. The final testing is performed at the board level and uses the same or similar ATE as a wafer test.
Automated generation of the test formula or an automated test pattern (ATPG) is a metoDIKA used to help ATE in determining defects or faults when testing an integrated circuit. A number of ATPG processes are currently used, including stuck, sequential and algorithmic methods. These structural methods have replaced functional testing in many applications. Algorithmic methods were primarily developed to process more complicated testing of integrated circuits for a very large scale of integrated (VLSI) circuits.
Many electronic circuits are produced to include built-in Self-Adair (BISR) functionality as part of the design technique for test (DFT), which allows faster and cheaper testing of integrated circuits. They are available depending on factors such as implementation and purpose, specialized variations and versions of the bist. Several examples are programmable autotest (Pbist), continuous built -in autotest (CBIST) and built -in autotest (Pupbist).
when performing testsThe integrated circuits on the boards are one of the most common methods of the functional test at the board level. This test is a simple method of determining the basic function of the circuit and in general further testing is implemented. Some other tests on board are a border scan test, a smaller test vector and a vector -based test.
Border scanning is usually carried out using the 1149.1 Institute of Electrical and Electronic Engineers (IEEE), commonly referred to as a common test action group (JTAG). Automated integrated circuit testing has been developing since 2011. The predecessors of this solution are two primary methods, an automated optical inspection (AOI) and an automated X -ray inspection (AXI) for failure detection. Testing integrated circuits will continue to evolve as electronic technologies Becoji more complex and microchip manufacturers want a more efficient and cost -effective solution.