What Is a Scanning Acoustic Microscope?
Ultrasound scanning microscope is a non-destructive testing equipment using ultrasound as a propagation medium. Scanning methods such as reflection or transmission are used in the work to inspect defects such as layering, voids and cracks in samples of components, materials, and wafers.
Ultrasound scanning microscope
- By transmitting high-frequency ultrasonic waves to the interior of the sample, when passing through the interface between two different materials, due to the different acoustic impedances of different materials, the absorption and reflection of sound waves are different, and the reflected or penetrated ultrasonic energy information is collected. Or change in phase information to check for defects such as delamination, cracks or voids in the sample. Advanced acoustic microimaging technology is an important means for inspecting and finding defects in various samples in many industries. The advantages of this non-destructive testing technique are especially prominent when inspecting materials while maintaining a complete sample.
- Utilizing the nature of ultrasonic pulse echo, the piezoelectric transducer is excited to emit multiple beams of ultrasound to be transmitted to the sample through the coupling liquid medium. The mechanical wave transmission process of acoustic waves is similar to electromagnetic waves, and phenomena such as refraction and reflection occur when passing through different media Through the use of materials with different acoustic impedance, waveform phase and energy changes will occur. After a series of data acquisition calculations, a gray value picture can be formed to analyze the internal conditions of the sample.
- As a kind of non-destructive testing analysis, it can realize the detection of materials without damaging the electrical energy of the materials and maintaining the structural integrity. It is widely used in material inspection (IQC), failure analysis (FA), destructive physical analysis (DPA), reliability analysis, component secondary screening, quality control (QC), quality assurance and reliability (QA / REL ), R & D and other fields.
- Features
- Non-destructive and non-destructive to the sample. High resolution allows pinpointing the precise location of defects inside the sample.
- Way of working
- According to the received information mode, it can be divided into reflection mode and transmission mode. According to the scanning method, it can be divided into C scanning, B scanning, X scanning, Z scanning, sub focus scanning, sub frequency scanning, and other methods.
- Secondary marking counterfeit identification
- Secondary marking of plastic devices