What is an automatic test device?

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automatic testing device performs comprehensive tests for boards with circuits, integrated circuits and other electronic devices. Testing usually takes place in a production environment where automated, relatively high -speed testing is important. Automatic testing equipment can use various techniques, including functional testing of circuits, optical examination and X -ray check. Semiconductors often use microprocessors, memory chips and analog integrated circuits to test microprocessors. Automated test equipment is also used by electronics manufacturers to verify the correct operation of circuits, avionic systems and electronic components. Other systems are very complex and perform dozens of functional and parametric tests with different test tools. Some may change the physical environment of the test of the part ofitacé. For example, the device can be tested inside the chamber, which is under the control of the computer undergoing extreme heat or cold. Depending on the nature of the device may be testedIt also includes exposing a range of light, sound or pressure.

collected plates with circuits with their parts, which are already soldered, can be tested with a number of automatic test devices. Some systems use optical inspection units that search each plate for solder problems, including bridges, shorts and poor quality joints. These systems use high -resolution mobile cameras and are usually able to detect incorrectly and missing components. Test systems can also use a three -dimensional X -ray inspection to discover problems that are not visible during standard optical control. For example, X -ray systems can "see" inside the solder joints under the ball grid field integrated circuits and an opening chips.

Many types of automatic test devices include robotic service systems that obtain and correctly place each tested part. In the veilThe isnost on the type of testing device may rotate or move each device several times before all testing is completed. Especially silicon wafers contain many individual semiconductor devices to be tested. During testing, the test device moves during testing a robotic unit called discuss along the wafer from the device to the device. It can also turn or re -align the wafer if necessary.

Once the physical device, board or wafers have been tested completely, the robotic sorter can move it from the test station to one of several containers. There are usually multiple magazines, so problematic devices can be sorted according to which tests have failed. Some of the automatic testing environments include various test devices at each of several stations. The tested equipment can be moved from the station to the station by human workers or robotic handlers and is suitable.